X-RAY ATTENUATION COEFFICIENTS FOR COPPER IN THE ENERGY RANGE 5 TO 50 KEVGERWARD L.1982; Z. NATURFORSCH., A; ISSN 0340-4811; DEU; DA. 1982; VOL. 37; NO 5; PP. 451-459; BIBL. 54 REF.Article

IMPLANTATION-INDUCED STRAINS IN SILICON STUDIED BY X-RAY INTERFEROMETRY AND TOPOGRAPHY.GERWARD L.1978; PHILOS. MAG., A; G.B.; DA. 1978; VOL. 37; NO 1; PP. 95-106; BIBL. 22 REF.Article

X-RAY ATTENUATION COEFFICIENTS OF CARBON IN THE ENERGY RANGE 5 TO 20 KEVGERWARD L.1983; ACTA CRYSTALLOGRAPHICA. SECTION A. CRYSTAL PHYSICS, DIFFRACTION, THEORETICAL AND GENERAL CRYSTALLOGRAPHY; ISSN 0567-7394; DNK; DA. 1983; VOL. 39; NO 3; PP. 322-325; BIBL. 22 REF.Article

THE ENERGY FLOW OF X-RAYS IN GERMANIUM SINGLE CRYSTALSGERWARD L.1973; Z. NATURFORSCH., A; DTSCH.; DA. 1973; VOL. 28; NO 5; PP. 577-580; BIBL. 12 REF.Serial Issue

X-RAY STUDY OF LATERAL STRAINS ON ION-IMPLANTED SILICONGERWARD L.1973; Z. PHYS.; DTSCH.; DA. 1973; VOL. 259; NO 4; PP. 313-322; BIBL. 19 REF.Serial Issue

ON THE CRITERION OF EQUAL INTENSITIES IN A HIGH-PRECISION LAUE METHOD FOR CRYSTAL ORIENTATION.GERWARD L.1976; J. APPL. CRYSTALLOGR.; DENM.; DA. 1976; VOL. 9; NO 3; PP. 241-242; BIBL. 6 REF.Article

X-RAY ATTENUATION COEFFICIENTS AND ATOMIC PHOTOELECTRIC ABSORPTION CROSS SECTIONS OF SILICONGERWARD L.1981; J. PHYS. B; ISSN 0022-3700; GBR; DA. 1981; VOL. 14; NO 18; PP. 3389-3395; BIBL. 17 REF.Article

INVESTIGATION OF THE ENERGY FLOW OF X-RAY WAVEFIELDS IN CRYSTALSGERWARD L.1978; KRISTALL U. TECH.; DDR; DA. 1978; VOL. 13; NO 9; PP. 1087-1093; ABS. GER; BIBL. 11 REF.Article

RELATIONS BETWEEN INTEGRATED INTENSITIES IN CRYSTAL DIFFRACTION METHODS FOR X-RAYS AND NEUTRONS.BURAS B; GERWARD L.1975; ACTA CRYSTALLOGR., A; DANEM.; DA. 1975; VOL. 31; NO 3; PP. 372-374; BIBL. 5 REF.Article

On the attenuation of X-rays and γ-rays in dilute solutionsGERWARD, L.Radiation physics and chemistry (1993). 1996, Vol 48, Num 6, pp 697-699, issn 0969-806XArticle

Atomic photoeffect cross sections for beryllium, carbon, silicon and copper from 5 to 20 keVGERWARD, L.Journal of physics. B. Atomic, molecular and optical physics (Print). 1989, Vol 22, Num 12, pp 1963-1969, issn 0953-4075Article

X-ray attenuation coefficients of beryllium in the energy range 5 to 20 keV = Coefficients d'atténuation des rayons X du béryllium dans le domaine d'énergies 5-20 KeVGERWARD, L.Acta crystallographica. Section A, Foundations of crystallography. 1989, Vol 45, pp 1-3, issn 0108-7673, 1Article

X-ray attenuation coefficients : current state of knowledge and availabilityGERWARD, L.International journal of radiation applications and instrumentation. Part C, Radiation physics and chemistry. 1993, Vol 41, Num 4-5, pp 783-789, issn 1359-0197Article

X-RAY STEP SCANNING TOPOGRAPHY.ANDERSEN AL; GERWARD L.1974; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1974; VOL. 23; NO 2; PP. 537-542; ABS. ALLEM.; BIBL. 7 REF.Article

X-RAY ATTENUATION IN SILICON AND GERMANIUM IN THE ENERGY RANGE 25 TO 50 KEV.GERWARD L; THUESEN G.1977; Z. NATURFORSCH., A; DTSCH.; DA. 1977; VOL. 32; NO 6; PP. 588-593; BIBL. 22 REF.Article

HIGH-DOSE ARGON IMPLANTATION IN SILICON STUDIED BY X-RAY TOPOGRAPHYZIELINSKA ROHOZINSKA E; GERWARD L.1980; PHILOS. MAG., A; ISSN 0141-8610; GBR; DA. 1980; VOL. 41; NO 3; PP. 321-330; BIBL. 14 REF.Article

PREPARING POLISHED CRYSTAL SLICES WITH HIGH PRECISION ORIENTATION.MATHIESEN SI; GERWARD L; PEDERSEN O et al.1974; REV. SCI. INSTRUM.; U.S.A.; DA. 1974; VOL. 45; NO 2; PP. 278-279; BIBL. 1 REF.Article

ON THE USE OF WIDE-ANGLE ENERGY-SENSITIVE DETECTORS IN WHITE-BEAM X-RAY SINGLE-CRYSTAL DIFFRACTIONBURAS B; OLSEN JS; GERWARD L et al.1980; NUCL. INSTRUM. METHODS; ISSN 0029-554X; NLD; DA. 1980; VOL. 178; NO 1; PP. 131-135; BIBL. 8 REF.Article

HIGH-PRECISION ORIENTATION OF CRYSTALS USING THE LAUE METHOD WITH CHARACTERISTIC X-RAYS.CHRISTIANSEN G; GERWARD L; ALSTRUP I et al.1975; ACTA CRYSTALLOGR., A; DANEM.; DA. 1975; VOL. 31; NO 1; PP. 142-145; H.T. 2; BIBL. 8 REF.Article

THE PHASE PROBLEM IN CRYSTALLOGRAPHY: PROPOSAL FOR AN EXPERIMENTAL SOLUTION.COTTERILL RMJ; GERWARD L; LINDEGAARD ANDERSEN A et al.1978; PHYS. SCRIPTA; SUEDE; DA. 1978; VOL. 17; NO 4; PP. 461-462; BIBL. 10 REF.Article

MULTIPLE DIFFRACTION IN CRYSTALS STUDIED BY AN X-RAY ENERGY-DISPERSIVE METHODCOUSINS CSG; GERWARD L; OLSEN JS et al.1978; PHYS. STATUS SOLIDI, A; DDR; DA. 1978; VOL. 48; NO 1; PP. 113-119; ABS. GER; BIBL. 5 REF.Article

PARTICLE SIZE AND STRAIN BROADENING IN ENERGY-DISPERSIVE X-RAY POWDER PATTERNS.GERWARD L; MORUP S; TOPSOE H et al.1976; J. APPL. PHYS.; U.S.A.; DA. 1976; VOL. 47; NO 3; PP. 822-825; BIBL. 8 REF.Article

QUANTITATIVE DETERMINATION OF PREFERRED ORIENTATION BY ENERGY DISPERSIVE X-RAY DIFFRACTION.GERWARD L; LEHN S; CHRISTIANSEN G et al.1976; TEXTURE; G.B.; DA. 1976; VOL. 2; NO 2; PP. 95-111; BIBL. 10 REF.Article

A SPECTROMETER FOR X-RAY ENERGY-DISPERSIVE DIFFRACTION USING SYNCHROTRON RADIATIONOLSEN JS; BURAS B; GERWARD L et al.1981; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1981; VOL. 14; NO 10; PP. 1154-1158; BIBL. 6 REF.Article

COMMENTS ON HIGH-PRECISION ORIENTATION OF CRYSTALS USING THE LAUE METHOD WITH CHARACTERISTIC X-RAYS BY G. CHRISTIANSEN, L. GERWARD AND I. ALSTRUP.MCINTYRE GJ; BARNEA Z; CHRISTIANSEN G et al.1976; ACTA CRYSTALLOGR., A; DENM.; DA. 1976; VOL. 32; NO 1; PP. 168; BIBL. 3 REF.Article